Measurement Computing IOtech 640 Series - Manual (Page 13)

IOtech 640 & 650 Series 878893 What are IOtech 640 & 650 Series Devices? 1-1
What are IOtech 640 and 650 Series Devices ? 1
* The actual model number includes an “e” or “u” to indicate Ethernet or USB version.
IOtech 640 and 650 Series Panels
IOtech 640 and 650 Series devices are dynamic signal analyzers used for monitoring and analyzing
machinery and structures in regard to sound, vibration, and rotation. The device hardware is the signal
conditioning and acquisition engine, while the software defines the specific analysis and monitoring
features of the system. Since the software [in the host PC] determines which capabilities will be used, it is
easy to upgrade the system and add more capabilities over time.
There are currently 4 models in the 640 and 650 product line. These are 640e, 640u, 650e, and 650u,
where
“e” indicates Ethernet Interface and “u” indicates USB2.0 Interface. The following matrix compares
model features.
Model Interface
Analog
Input
Channels
High Pass
Filter
Cutoff
Analog
Input
Range
Analog
Output
Channels
Digital I/O
Channels
External
Power
Connector
640e
Ethernet
10/100BaseT
640u USB2.0
4 1.0 Hz ±10 V 1
650e
Ethernet
10/100BaseT
650u USB2.0
5 0.1 Hz ±40 V 0
8
6 to 16 VDC
1 amp (max.)
There are four end-user software application packages available for IOtech 640 and IOtech 650 systems. A
brief description of each follows. For more information refer to Chapter 10, Software Options. For
detailed information refer to the specific software user’s manual. The data acquisition CD includes PDF
versions of the software documents.
eZ-Analyst Used to record and analyze time history data; as well as perform impact (resonance)
testing.
eZ-TOMAS Used to acquire, monitor, and analyze rotating machinery data for steady-state and
transient conditions.
eZ-Balance Used to field balance multi-plane rotating machinery.
eZ-NDT Used to determine the quality of production parts during the manufacturing process.
eZ-NDT is a non-destructive, resonance-based, testing process.