AMETEK CSW Series - Manual (Page 145)

User Manual California Instruments
CSW Series 145
Other Dip levels for 2 phase selections.
Note that any other dip level not listed in this table will result in voltage dips conform method (B) so both
phases will dip by the actual dip percentage set.
To implement user defined three phase dips other than those listed in this table, the IEC411 phase
setting for phases A, B and C may be used to set the desired phase angle for each dips. This setting is
ignored if the dip levels is set to 80, 70 or 40 but otherwise controls the phase angle of the selected
phase during the dip.
8.2.5 Tests Performed
DIPS AND INTERRUPTIONS
1. Run All Run predefined sequence of tests.
2. Run Single Run user defined test.
VOLTAGE VARIATIONS
1. Run All Run predefined sequence of tests.
2. Run Single Run user defined test.
8.2.6 Front Panel Entry
To perform a test from the keyboard, select the APPLICATIONS screen from the MENU 2
screen. The APPLICATIONS screen will appear as shown in Figure 8-13
Figure 8-13: Application menu
Scroll to the IEC 1000-4-11 entry using the up and down cursor keys. Press the ENTER key to
select the IEC 1000-4-11 main menu. The screen will appear as shown in Figure 8-14.
Figure 8-14: IEC1000-4-11 Menu