Teledyne LeCroy Summit Z3-16 PCI Express Multi-lane Exerciser User Manual - Manual (Page 12)

Teledyne LeCroy PCI Express Test Platform Features
12 Summit Z3‐16 PCI Express Multi‐Lane Exerciser User Manual
1.7 PCI Express Test Platform Features
The PCI Express Test Platform has the following features:
 The PCI Express Test Platform accessory to the Summit Z3‐16 Exerciser allows
testing and debugging of the PCI Express cards by providing host emulation.
 The PCI Express Test Platform supports PCIe rates up to 8 GT/s.
 Lane widths of x1, x2, x4, x8 and x16 are supported.
 Mechanical support and power is provided for both the Summit Z3‐16 Exerciser
and the device under test (DUT).
 Flexible Reference Clock options.
 The PCI Express Test Platform provides a PCIe clock. Clocking with or without
SSC (Spread Spectrum Clocking) can be selected. Additionally, an external
clock can be provided through a SMA connector.
 Power ON/OFF for the DUT.
 DUT power control
 DUT power can be switched off without powering PCI Express Test Platform
off.
Figure 1.2: PCI Express Test Platform 16x2.5GT/s / 16x5.0GT/s / 16x8.0GT/s