Atec Agilent-8722ES - Manual (Page 18)

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Gating
The gating function can be used to selectively
remove reflection or transmission time-domain
responses. In converting back to the frequency
domain, the effects of the responses outside the
gate are removed. The location and span of the
gate can be controlled by either setting the center
position and time span of the gate, or by setting
the start and stop time of the gate.
High-stability frequency reference (Option 1D5)
This option provides the analyzer with ±0.05 ppm
temperature stability from 0 to 60° C (referenced
to 25° C).
High-power system (Option 085)
This option is designed to permit the measurement
of high-power amplifiers at RF levels up to 20 watts
(+43 dBm), with full two-port calibration. A switch
is added to the reference path so that booster
amplifier response can be ratioed out. To protect
the analyzer from high power levels, this option
allows the addition of isolators at both test ports
and includes internally controlled step attenuators
between couplers and samplers. Bias tees, isolators,
and booster amplifiers are not included. Network
analyzers with Option 085 can also be configured
to operate as standard instruments with degraded
power accuracy or as instruments capable of mak-
ing single-connection multiple measurements.
Option 085 includes direct access to the samplers
(Option 012).
Mechanical transfer switch (Option 007)
This option replaces the solid-state transfer switch
with a mechanical switch in the test set, increasing
the test port power and dynamic range. Continuous
switching is not available in this configuration.
Frequency offset mode (Option 089)
This option adds the ability to offset the source
and receiver frequencies for frequency-translated
measurements. This provides the instrument with
mixer measurement capability. It also provides a
graphical setup that allows easy configuration of
your measurement.
Direct-access receiver configuration
(Option 012)
This option provides front panel access to the A
and B samplers for improved receiver sensitivity.
Option 012 improves signal-to-noise in free-space
materials measurements. Direct connection of the
reflection antennas to the A and B samplers elimi-
nates internal reflections of the transmitted signal
in the reflection path, improving the signal to noise
ratio. Option 012 also allows you to add attenua-
tors between the couplers and samplers, increasing
the power handling capability of the instrument.
Fourth sampler and TRL calibration firmware
(Option 400)
This option converts the built-in test set to a four-
sampler configuration, allowing TRL calibration.
This provides the highest accuracy for non-coaxial
environments, such as on-wafer probing, and
in-fixture or waveguide measurements.
Agilent 8719ET, 8720ET, 8722ET
Step attenuator (Option 004)
Adds a 55 dB step attenuator to extend the mini-
mum source power level by 55 dB.
Time-domain (Option 010)
With the time-domain option, data from transmis-
sion or reflection measurements in the frequency
domain are converted to the time domain using
a Fourier transformation technique (chirp Z) and
presented on the display. The time-domain response
shows the measured parameter value versus time.
Markers may also be displayed in electrical length
(or physical length if the relative propagation
velocity is entered).
High-stability frequency reference (Option lD5)
This option provides the analyzer with ±0.05 ppm
temperature stability from 0 to 60° C (referenced
to 25° C).
Options, continued