6 program and erase characteristics, 7 power-up conditions, 8 input test waveforms and measurement levels – Rainbow Electronics AT25DF081A User Manual
Page 45: 9 output test load
45
8715C–SFLSH–11/2012
AT25DF081A
14.6
Program and Erase Characteristics
Notes:
1. Maximum values indicate worst-case performance after 100,000 erase/program cycles
2. Not 100% tested (value guaranteed by design and characterization)
14.7
Power-up Conditions
14.8
Input Test Waveforms and Measurement Levels
14.9
Output Test Load
Symbol
Parameter
Min
Typ
Max
Units
t
PP
Page Program Time (256-Bytes)
1.0
3.0
ms
t
BP
Byte Program Time
7
µs
t
BLKE
Block Erase Time
4-Kbytes
50
200
ms
32-Kbytes
250
600
64-Kbytes
400
950
t
CHPE
Chip Erase Time
16
28
sec
t
OTPP
OTP Security Register Program Time
200
500
µs
t
WRSR
Write Status Register Time
200
ns
Symbol
Parameter
Min
Max
Units
t
VCSL
Minimum V
CC
to Chip Select Low Time
100
µs
t
PUW
Power-up Device Delay Before Program or Erase Allowed
10
ms
V
POR
Power-on Reset Voltage
1.5
2.5
V
AC
DRIVING
LEVELS
AC
MEASUREMENT
LEVEL
0.1V
CC
V
CC
/2
0.9V
CC
t
R
, t
F
< 2 ns (10% to 90%)
DEVICE
UNDER
TEST
15pF (frequencies above 70MHz)
or
30pF