GE Industrial Solutions Entellisys 4.0 System Test Kit User Manual - Manual (Page 65)

65
A Definition of terms
The terms listed and defined are displayed in the Test Kit and are used throughout this guide.
Table A-21 Definition of terms
Term Definition
ATT Automatic Trip Time Test.
CT Current Transformer—a sensor that measures current. There are normally 3 CTs, one
for each phase, and an optional neutral CT.
CT Compensation The system is designed to compensate for particular characteristics of the CTs used
in the Entellisys System in order to improve accuracy. If a user is testing the system
through secondary injection (input into the CT inputs of the EntelliGuard Messenger),
then the unique compensation algorithm must be disabled or test results will be
incorrect.
CT Rating Rating of connected Current Transformer for that circuit breaker.
DAQ Data Acquisition
Fault/Fault Level The period of time and/or the voltage current condition during a fault.
Flux Shifter One of two means to actuate the circuit breaker. The flux shifter is used to open (and
lockout) the circuit breaker when the CPU or EntelliGuard Messenger issues a trip
signal.
Frame Rating Frame Size or Rating of the Circuit Breaker.
GF Ground Fault overcurrent protection function
GF Defeat Some tests like single phase tests, will trigger GF trips unintentionally. Therefore, it
may be desirable to disable or defeat GF temporarily during these tests.
HC High Current Alarm protection function
HMI Human Machine Interface
IOC Instantaneous overcurrent protection function
LT Long Time overcurrent protection function
Manual Breaker
Injection User must manually setup the circuit breaker configuration and power line
characteristics to be injected into the system. Might be desired for a quick test.
NAN Not a number—error message that gets displayed.
No Trip Test A test that does not cause the circuit breaker to trip
OF Over frequency relay protection function
OV Overvoltage relay protection function