Atec Agilent-85133F - Manual (Page 46)

46 Installation and User’s Guide
1 Introducing the Agilent 85225F Performance Modeling System
The 1/f Noise Subsystem
The Agilent 35670A dynamic signal analyzer (in conjunction with a
customer- furnished Stanford Model SR570 low noise amplifier) measures
the flicker noise (1/f noise) of active devices. Controlled by IC- CAP device
modeling software, the dynamic signal analyzer generates reliable 1/f noise
measurement data, which are analyzed and extracted in IC- CAP.
Figure 17
shows the system configuration for 1/f noise measurements.
Figure 16 System Block Diagram