Atec Agilent-85133F - Manual (Page 130)

1/f Noise Subsystem Functional Verification Test E
Installation and User’s Guide 135
Performing the 1/f Noise Subsystem Functional Verification Test
If the performance of the Agilent 35670A dynamic signal analyzer is in
question, complete the following steps to verify operation.
To perform the RF subsystem functional verification test
Step Action Notes
1 Activate the dynamic
signal analyzer.
a Connect the dynamic signal
analyzer to line power.
b Switch on the line power.
The instrument performs the self test during
power-up.
2 View the results. a Observe the results on the analyzer
display.
If the instrument self test fails, consult “Chapter
4. Troubleshooting the Analyzer,” in the Agilent
35670A dynamic signal analyzer service guide.