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Rx-tx alignment procedures, Rf12 – Rainbow Electronics RF12 User Manual

Page 26

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RF12

allowable local oscillator frequency error.

Whenever a low frequency error is essential for the application, it is possible to “pull” the crystal to

the accurate frequency by changing the load capacitor value. The widest pulling range can be achieved if

the nominal required load capacitance of the crystal is in the “midrange”, for example 16 pF. The

“pull-ability” of the crystal is defined by its motional capacitance and C

0

.

RX-TX ALIGNMENT PROCEDURES

RX-TX frequency offset can be caused only by the differences in the actual reference frequency. To

minimize these errors it is suggested to use the same crystal type and the same PCB layout for the

crystal placement on the RX and TX PCBs.

To verify the possible RX-TX offset it is suggested to measure the CLK output of both chips with a

high level of accuracy. Do not measure the output at the XTL pin since the measurement process itself

will change the reference frequency. Since the carrier frequencies are derived from the reference

frequency, having identical reference frequencies and nominal frequency settings at the TX and RX side

there should be no offset if the CLK signals have identical frequencies.

It is possible to monitor the actual RX-TX offset using the AFC status report included in the status

byte of the receiver. By reading out the status byte from the receiver the actual measured offset

frequency will be reported. In order to get accurate values the AFC has to be disabled during the read by

clearing the "en" bit in the AFC Control Command (bit 0).

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