Metrohm 861 Advanced Compact IC - Manual (Page 95)

5.1 Technical data
861 Advanced Compact IC / Instructions for Use 8.861.1033
85
5 Appendix
5.1 Technical data
Unless otherwise specified, the published data com-
prises typical values for the 861 Advanced Compact IC
at an ambient temperature of 25 °C.
5.1.1 Conductivity measurement
Measurement range 1 0 … 5000 µ S/cm (resolution: 2.80 nS/cm)
Measurement range 2 0 … 1000 µ S/cm (resolution: 0.56 nS/cm)
Measurement range 3 0 … 250 µ S/cm (resolution: 0.14 nS/cm)
Measurement range 4 0 … 50 µ S/cm (resolution: 0.028 nS/cm)
Maximum error ± 1 % of full scale value and
± 1 % of measurement value (k = 16.7/cm)
Linearity Deviations < ± 0.5 % of full scale value
Noise typ. 0.2 nS/cm (Total noise of the system -
chemical and electronical with separation column
and sequential suppression)
Drift (electronic) typ. < 10 ppm/h of full scale value
Temperature dependence typ. < 40 ppm/°C of full scale value
Reserve range > 33 % (k = 16.7/cm)
Sampling rate 10 measurements/s (fixed)
5.1.2 Conductivity detector
Construction Thermostatted conductivity detector with
2 ring-shaped steel electrodes
Measurement principle Alternating current measurement with 1 kHz fre-
quency and approx. 1.7 V amplitude (peak to
peak).
Effective cell volume 0.8 µ L
Cell constant approx. 17 /cm (the exact value is printed on the
detector)
Maximum back pressure
for measuring cell
5.0 MPa (50 bar)
Thermostatting Connectable dynamic control to adjustable oper-
ating temperature
Operating temperature Adjustable in steps of 5°C from 25 … 45°C