Atec Agilent-81150A-81160A User Manual

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Pass through pattern for combined
physical and protocol test
up to 10 Mbit/s

The 81150A and the 81160A pattern generators let you deﬁ ne the transitions from one bit
to the other so that the previous bit inﬂ uences the current bit. The user can set up own
deﬁ ned arbitrary bit shapes.

In addition to user-deﬁ ned patterns, standard patterns like PRBS up to 2

are available.

The sequencer allows setting up a pre-amble sequence so that the device under test
moves into test mode.

Additionally to 2-level signals, it is also possible to create 3- and even 4-level signals. With
the 3-level signals, it is no longer necessary to add different signals for electrical idle.
3-level signals are important e.g. for use in Ethernet environment and 4-level signals e.g.
for PAM4 applications.

Besides, standard trigger modes like continuous bit and block trigger modes allow adop-
tions to application needs. In the bit mode you see that on every trigger, the sequence
is advanced by one bit. An application example is a bit clock, which can be fed into an
external clock and then into the trigger input.

In the block mode the entire data block is generated once per trigger event. This is
interesting for example in applications with protocol data.

PRBS

Sequencer

2-, 3- and 4-level signals

Bit and block trigger mode

The 81150A and the 81160A pattern generators pass the data through to the device
under test and adopts it to any kind of stress test (shape and timing change).

NRZ

NRZ mode with minimum
transition times

Transition
time

Period

Min voltage level

Max voltage level

Data pattern: 01001101

Output waveform

Bit shape waveforms
(user deﬁned)

0→0

1→0 1→1

0→1

NRZ mode with minimum
transition times

NRZ mode with transition
time = 1/3 period

Mode

Bit shape

Arbitrary

Stress your device to its limits – deﬁ ne your own bit shape

MOD

Sends out protocol
data; e.g. VPT 1000
for FlexRay

Real-time data pass
through with ﬂexible
modulation and
re-stress test

Protocol handshake

Pass/fail test

DUT

Protocol

exerciser

81150A/81160A

pass through

pattern

Bridge the gap between protocol and physical layer test – in real time up to 10 Mbit/s

The pass-through pattern functionality takes the protocol data via “mod in” and adopts it
to any kind of stress test (shape and timing changes).

Increase your test efficiency by combining physical layer test with protocol test

Emulate effects like...

• Capacitive load of the channel

• Asymmetric

delay

• Crossing point deviations

• Duty cycle distortions

• Arbitrary transition times

• Level

noise

• Delays from/to electrical idle

...By deﬁ ning the transitions so that the
previous bit inﬂ uences the current bit