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Test port input (continued), General information, Group delay – Atec Agilent-PNA Series User Manual

Page 13

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Test port input (continued)

Group delay

a

Description

Specification

Supplemental information

Aperture (selectable)

(frequency span)/(number of points – 1)

Maximum aperture

20% of frequency span

Range

0.5 x (1/minimum aperture)

Maximum delay

Limited to measuring no more than 180° of
phase change within the minimum aperture.

The following graph shows characteristic group delay accuracy with type-N full 2-port calibration and a 10 Hz IF bandwidth.
Insertion loss is assumed to be < 2 dB and electrical length to be ten meters.

In general, the following formula can be used to determine the accuracy, in seconds, of a specific group delay measurement:

±Phase accuracy (deg)/[360 x Aperture (Hz)]

Depending on the aperture and device length, the phase accuracy used is either incremental phase accuracy or worse case phase
accuracy.

a. Group delay is computed by measuring the phase change within a specified frequency step (determined by the frequency span and the number of points per sweep).

Description

Supplemental Information

System IF bandwidth range

1 Hz to 40 kHz in a 1, 2, 3, 5, 7, 10 sequence up to 30 kHz, 35 kHz, 40 kHz, nominal

RF connectors

Type-N, female; 50

Ω, nominal

Connector center pin protrusion

0.204 to 0.207 in, characteristic

Probe power

3-pin connector, male

Positive supply

+15 VDC ±2%, 400 mA max, characteristic

Negative supply

–12.6 VDC ±5%, 300 mA max, characteristic

General information