Atec Agilent-8720D - Manual (Page 19)

19
System Capabilities
Limit lines
Define test limit lines that appear on the display
for go/no go testing. Lines may be any combination
of horizontal, sloping lines, or discrete data points.
Limit test TTL output available for external control
or indication.
Operating parameters
Display, print or plot current instrument operating
parameters.
Transform
When time domain (Option 010) is present, selects
the time domain transform menu.
Instrument mode
Select external source, tuned receiver, or frequency
offset mode.
External source mode
The receiver (input R) detects and phase-locks to
any externally generated CW signal. Receiver
inputs A and B will measure this same frequency
for comparison or tracking measurements.
Auto
The input signal frequency is counted and displayed.
Manual
Measures the input signal closest to the frequency
specified by the user (within –0.5 to +5 MHz).
Tuned receiver
Tunes the receiver for a synthesized CW input sig-
nal at a precisely specified frequency. The time
bases of the external RF source or sources must be
tied to the external reference input of the network
analyzer (rear panel BNC). The built-in RF source
is not used.
Frequency offset on/off
Sets the RF source to be swept at a frequency that
is offset from the receiver as required in a swept
RF/IF, fixed LO, mixer test. The maximum delay
between the RF source and the R channel input is
0.3 microseconds. Frequency offset mode requires
RF and IF frequencies to be in the specific range of
the instrument.
Offset value
Set the offset frequency value.
Service menu
Select the desired service test, service diagnostic,
service, or verification mode.
Test sequences
Description
Create, edit, save, or recall a series of front-panel
keystrokes to automate a measurement. Each of
the six sequence registers can hold approximately
200 instructions. Create or edit a sequence by
selecting the sequence menu and then simply per-
forming the front-panel keystrokes that would nor-
mally be used to make a manual measurement.
Test sequences may contain basic stimulus and
measurement functions (frequency, power, parame-
ter, format, scale) advanced operations (time
domain, limit testing, display marker values), and
basic logical branching (for example, IF limit test
fails DO sequence 5). Completed sequences are
then saved and can be executed when you are
ready to repeat the test.
Storage
Test sequences can be stored internally in RAM, to
an internal or external disk drive, or loaded from a
computer over the GPIB interface. Sequence 6 is
saved in non-volatile storage and can be used as an
autostart routine when titled AUTO.
Branching
Branch to another sequence on limit test pass/fail
or the loop counter value. Subroutines are also
possible via GOSUB.
Other GPIB instruments
Send simple commands to GPIB instruments via
the title string.
Test sequence BNC output
Set TTL high or low on the analyzer rear panel output.
General purpose input/output
Read or write bits to the output port to control
external devices such as part handlers. Eight out-
put and five input TTL lines are available on the
parallel port of the analyzer.
Other functions
Pause/continue, wait, title sequence, print
sequence, duplicate sequence, pause, and select.