Analyzer options (continued) – Atec Agilent-8720D User Manual
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Option 085, high power system
This option is designed to permit the measurement
of high power amplifiers at RF levels up to 20 Watts
(+43 dBm), with full two-port calibration. A switch
is added to the reference path so that booster
amplifier response can be ratioed out. To protect
the analyzer from high power levels, this option
allows the addition of isolators at both test ports
and includes internally controlled step attenuators
between couplers and samplers. Bias tees, isolators
and booster amplifiers are not included. Network
analyzers with option 085 can also be configured
to operate as standard instruments with degraded
power accuracy or as instruments capable of mak-
ing single connection multiple measurements.
Option 007, mechanical transfer switch
This option replaces the solid state transfer switch
with a mechanical switch in the test set, increasing
the test port power and dynamic range.
Option 089, frequency offset mode
This option adds the ability to offset the source
and receiver frequencies for frequency translated
measurements. This provides the instrument with
mixer measurement capability. It also provides a
graphical setup that allows easy configuration of
your measurement.
Option lD5, high stability frequency reference
This option provides the analyzer with ±0.05 ppm
temperature stability from 0 °C to 60 °C (refer-
enced to 25 °C).
Option 012, direct access receiver configuration
This option provides front panel access to the A
and B samplers for improved receiver sensitivity.
Option 012 improves signal-to-noise in free space
materials measurements with the use of multiple
antennas. Direct connection of the reflection
antennas to the A and B samplers eliminates inter-
nal reflections of the transmitted signal in the
reflection path, improving the signal to noise ratio.
Option 012 also allows you to add attenuators
between the couplers and samplers, increasing the
power handling capability of the instrument.
Option 400, fourth sampler
and TRL calibration firmware
This option converts the built-in test set to a four-
sampler configuration, allowing TRL calibration.
This provides the highest accuracy for non-coaxial
environments, such as on-wafer probing, in-fixture
or waveguide measurements.
Analyzer options (continued)