Allied Telesis NetExtreme II Adapters - Manual (Page 164)

Chapter 12: User Diagnostics
164
Group B: Memory Tests
B1 TXP Scratchpad
The Group B tests verify all of the memory
blocks of the Broadcom NetXtreme II adapter
by writing various data patterns (0x55aa55aa,
0xaa55aa55, walking zeroes, walking ones,
address, etc.) to each memory location,
reading back the data, and then comparing it
to the value written. The fixed data patterns
are used to ensure that no memory bit is stuck
high or low, while the walking zeroes/ones
and address tests are used to ensure

that memory writes do not corrupt adjacent
memory locations.
B2 TPAT Scratchpad
B3 RXP Scratchpad
B4 COM Scratchpad
B5 CP Scratchpad
B6 MCP Scratchpad
B7 TAS Header Buffer
B8 TAS Payload Buffer
B9 RBUF via GRC
B10 RBUF via Indirect
Access
B11 RBUF Cluster List
B12 TSCH List
B13 CSCH List
B14 RV2P Scratchpads
B15 TBDC Memory
B16 RBDC Memory
B17 CTX Page Table
B18 CTX Memory
Group C: Block Tests
C1 CPU Logic and
DMA Interface Verifies the basic logic functionality of all the
on-chip CPUs. It also exercises the DMA
interface exposed to those CPUs. The internal
CPU tries to initiate DMA activities (both read
and write) to system memory and then
compares the values to confirm that the DMA
operation completed successfully.
Table 17. Diagnostic Tests (Continued)
Test
Description
Number Name