Data sheet – Atec Tektronix-DPO7000 Series User Manual

Page 8

Data Sheet

Advanced Analysis, Jitter, Timing, and Eye Diagram Measurements

Advanced Analysis, Jitter, Timing, and Eye Diagram
Measurements

Tight timing margins associated with today’s serial buses demand stable,
low-jitter designs. DPO7000 models include an Essentials version of the
DPOJET software package that extends the oscilloscope’s measurement
capabilities by making measurements over contiguous clock and data
cycles in a single-shot real-time acquisition. DPOJET Essentials adds
multiple measurements, including Time Interval Error, Phase Noise, Skew,
Setup and Hold timing, Duty Cycle, Period, Positive/Negative Width, and
others, and provides the ability to measure key jitter and timing parameters
to help characterize possible system timing issues. Analysis tools such as
plots for time trends and histograms quickly show how timing parameters
change over time, like frequency drift, PLL startup transients, or a circuit’s
response to power supply changes. Spectrum analysis quickly shows the
precise frequency and amplitude of jitter and modulation sources.
Further analysis can be added with DPOJET Advanced (Option DJA) that
offers extended capabilities, providing a complete suite of analysis tools for
insight into jitter and timing as well as other signal quality issues. To the
basic jitter and timing measurements described above, DJA adds advanced
tools such as Rj/Dj separation, eye diagram masks, and Pass/Fail limits for
conformance testing. DPOJET Advanced is the measurement framework
that underlies several other Tektronix standards-specific compliance test
packages for applications such as DDR memory and USB.

Advanced Event Search and Mark –

Event Search and Mark will relieve

the user from the tedious task of examining data by highlighting important
events, skipping the unimportant ones, and enhancing the comprehension
of event relationships. You can navigate between the events of interest
effortlessly. Basic event (edge only) search and mark plus support for more
advanced event types like transition, setup and hold, or logic pattern are
available.

Accelerating the research of specific events in an acquired waveform.

Waveform Limit Testing –

This feature consists of comparing an acquired

waveform to boundaries. These boundaries are defined by the user to
specify a tolerance band around a reference waveform. If any part of the
acquired waveform falls outside of the limit, the software returns a failure
message and the location of the failure is shown on the waveform.

Communications Mask Testing (Opt. MTM) –

This feature provides

a complete portfolio of masks for verifying compliance to serial
communications standards. It supports 156 Standard Masks:

ITU-T (64 Kb/s to 155 Mb/s)
ANSI T1.102 (1.544 Mb/s to 155 Mb/s)
Ethernet IEEE 902.3, ANSI X3.263 (125 Mb/s to 1.25 Gb/s)
Sonet/SDH (51.84 Mb/s to 622 Mb/s)
Fibre Channel (133 Mb/s to 2.125 Gb/s)
USB (12 Mb/s to 480 Mb/s)
IEEE 1394 (491.5 Mb/s to 1.966 Gb/s)
RapidI/O (up to 2 Gb/s)
OIF Standards (1.244 Gb/s)
Video (143.18 Mb/s to 1.485 Gb/s)