Atec Agilent-E5062A - Manual (Page 10)

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Table 1-10 Test port input levels
Description Specification Supplemental information
Maximum test port input level
300 kHz to 3 GHz +10 dBm
Damage level
300 kHz to 3 GHz +20 dBm, ±30 VDC, typical
Crosstalk 1
300 kHz to 3 GHz -110 dB
Table 1-11 Test port input (trace noise 2 )
Description Specification Supplemental information
Trace noise magnitude
300 kHz to 1 MHz 8 mdB rms (23°C ±5°C)
(source power level = +10 dBm)
1 MHz to 3 GHz 5 mdB rms (23°C ±5°C)
(source power level = +10 dBm)
Trace noise phase
300 kHz to 1 MHz 0.05° rms (23°C ±5°C)
(source power level = +10 dBm)
1 MHz to 3 GHz 0.03° rms (23°C ±5°C)
(source power level = +10 dBm)
Test port input
1. Response calibration not omitted.
2. Trace noise is defined as a ratio measurement of a through, at IF bandwidth = 3 kHz.
3. Stability is defined as a ratio measurement at the test port.
Table 1-12 Test port input (stability 3 )
Description Specification Supplemental information
Stability magnitude
3 MHz to 3 GHz 0.01 dB/°C
(at 23°C ±5°C, typical)
Stability phase
3 MHz to 3 GHz 0.1°/°C
(at 23°C ±5°C, typical)