Industrial Data Systems IDS DT220 User Manual
Page 39

DT220 Users Manual version 1.a
Diagnostic Tests
35
Memory Display
The display prompts “Memory Address: xxxx”. Enter a memory address and press the
Enter key. The DT220 displays a block of memory. Use the Review (↑↑↑↑) and Cont. (↓↓↓↓)
keys or the numeric keypad to view other memory blocks. Press the
Clear Entry key to
exit memory display.
Com 1, 2, and 3 Tests
This test displays and transmits serial data on communications ports 1, 2 & 3. Press the
Enter key to transmit a test string of “1234567890ABCDEF” any received will display
automatically. If all data being received or transmitted is unintelligible, the baud rate or
data formats are probably incorrect. If nothing is displayed on the display, then check the
following:
1.
Cabling between the communicating units.
2.
Make sure the sending unit is actually sending data.
Press the CLEAR key to exit diagnostic the test and return to the menu.
A/D Test
This test displays the raw count data being read from the A/D converter. The speed and
filter settings will be displayed along with the average, high average, low average,
deviation, peak deviation & drift. Press the
Enter key to reset the values.
If no data is being displayed, the A/D converter is “locked up”. Turn power off and then
on and re-activate the test. Check load cell wiring for reversed signal or excitation
signals.
MMC Test
Use this function to display ID Database sectors.
TTL Input Test
Use this to test TTL inputs 1-7. The display will show the binary values 1,2,4,8,16,32,64
for the TTL ports 1-7. When shorted to ground the display will show 0 for the
corresponding input.
NOTE: TTL input 7 is the calibration function lock a 0 indicates
the lock is disabled and access to the scale configuration parameters are not restricted.
Pulse Input Test
Use this to test pulse counts on input 6. Every time TTL 6 is shorted to ground the
counter will increment.
Keyboard Test
Use this to test the keys on the keyboard. The character will display when the key is
pressed.