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Test set description – HP 8517B User Manual

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HP 8517B S-Parameter Test Set Manual

Getting Started

Test Set Description

Test Set Description

The HP 8517B test set configured with an HP 8510B/C network analyzer
and an HP 8360 series source, creates a system capable of making
S-parameter measurements from 45 MHz to 50 GHz. The system is
particularly suited for making two-port device measurements. You can
measure all four S-parameters without physically reversing the DUT (device
under test).

The system is also designed for making measurements on non-reciprocal
devices or components like transistors, amplifiers or isolators where S

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measurements are required.

Two directional couplers are used for signal separation. The configuration is
illustrated in the following figures:

Figure 1-1, “Standard HP 8517B Test Set Block Diagram"

Figure 1-2, “Option 004, HP 8517B Test Set Block Diagram"

Figure 1-3, “Option 007, HP 8517B Test Set Block Diagram"

For active-device measurements, two bias tees apply external DC bias to
both test port center conductors.

Figure 1-1

Standard HP 8517B Test Set Block Diagram