A/d specifications, Input sequencer, External acquisition scan clock input – Measurement Computing Personal Daq/3000 Series User Manual
Page 72

7-6 Specifications
937492
Note
: Specifications are subject to change without notice.
A/D Specifications
Type
: Successive approximation
Resolution
: 16 bit
Maximum Sample Rate
: 1 MHz
Nonlinearity (Integral)
: ±2 LSB maximum
Nonlinearity (Differential)
: ±1 LSB maximum
Input Sequencer
Analog, digital, and counter inputs can be scanned synchronously based on either an internal programmable
timer, or an external clock source. Analog and digital outputs can be synchronized to either of these clocks.
Scan Clock Sources: 2
Note:
The maximum scan clock rate is the inverse of the minimum scan period. The minimum scan period
is equal to 1µs times the number of analog channels. If a scan contains only digital channels then
the minimum scan period is 250 ns.
1.
Internal, programmable
Analog Channels from 1 µs to 19 hours in 20.83 ns steps
Digital Channels and Counters from 250 ns to 19 hours in 20.83 ns steps
2.
External, TTL level input
Analog Channels down to 1 µs minimum
Digital Channels and Counters down to 250 ns minimum
Programmable Parameters per Scan
: Channel (random order), gain
Depth
: 512 locations
On-module Channel-to-Channel Scan Rate
:
Analog: 1 MHz maximum
Digital: 4 MHz if no analog channels are enabled, 1 MHz with analog channels enabled
External Acquisition Scan Clock Input
Maximum rate
: 1.0 MHz
Clock Signal Range
: Logical zero 0V to 0.8V; Logical one 2.4V to 5.0V
Minimum pulse width
: 50 ns high, 50 ns low