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Switching characteristics – Cypress CY7C1443AV33 User Manual

Page 21

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CY7C1441AV33

CY7C1443AV33,CY7C1447AV33

Document #: 38-05357 Rev. *G

Page 21 of 31

Switching Characteristics

Over the Operating Range

[22, 23]

Parameter

Description

–133

–100

Unit

Min.

Max.

Min.

Max.

t

POWER

V

DD

(Typical) to the first Access

[18]

1

1

ms

Clock

t

CYC

Clock Cycle Time

7.5

10

ns

t

CH

Clock HIGH

2.5

3.0

ns

t

CL

Clock LOW

2.5

3.0

ns

Output Times

t

CDV

Data Output Valid After CLK Rise

6.5

8.5

ns

t

DOH

Data Output Hold After CLK Rise

2.5

2.5

ns

t

CLZ

Clock to Low-Z

[19, 20, 21]

2.5

2.5

ns

t

CHZ

Clock to High-Z

[19, 20, 21]

3.8

0

4.5

ns

t

OEV

OE LOW to Output Valid

3.0

3.8

ns

t

OELZ

OE LOW to Output Low-Z

[19, 20, 21]

0

0

ns

t

OEHZ

OE HIGH to Output High-Z

[19, 20, 21]

3.0

4.0

ns

Setup Times

t

AS

Address Setup Before CLK Rise

1.5

1.5

ns

t

ADS

ADSP, ADSC Setup Before CLK Rise

1.5

1.5

ns

t

ADVS

ADV Setup Before CLK Rise

1.5

1.5

ns

t

WES

GW, BWE, BW

X

Setup Before CLK Rise

1.5

1.5

ns

t

DS

Data Input Setup Before CLK Rise

1.5

1.5

ns

t

CES

Chip Enable Setup

1.5

1.5

ns

Hold Times

t

AH

Address Hold After CLK Rise

0.5

0.5

ns

t

ADH

ADSP, ADSC Hold After CLK Rise

0.5

0.5

ns

t

WEH

GW, BWE, BW

X

Hold After CLK Rise

0.5

0.5

ns

t

ADVH

ADV Hold After CLK Rise

0.5

0.5

ns

t

DH

Data Input Hold After CLK Rise

0.5

0.5

ns

t

CEH

Chip Enable Hold After CLK Rise

0.5

0.5

ns

Notes

18. This part has a voltage regulator internally; t

POWER

is the time that the power must be supplied above V

DD

(minimum) initially, before a read or write operation can be

initiated.

19. t

CHZ

, t

CLZ

,t

OELZ

, and t

OEHZ

are specified with AC test conditions shown in part (b) of

“AC Test Loads and Waveforms”

on page 20. Transition is measured ± 200 mV

from steady-state voltage.

20. At any given voltage and temperature, t

OEHZ

is less than t

OELZ

and t

CHZ

is less than t

CLZ

to eliminate bus contention between SRAMs when sharing the same data

bus. These specifications do not imply a bus contention condition, but reflect parameters guaranteed over worst case user conditions. Device is designed to achieve
High-Z prior to Low-Z under the same system conditions.

21. This parameter is sampled and not 100% tested.
22. Timing reference level is 1.5V when V

DDQ

= 3.3V and is 1.25V when V

DDQ

= 2.5V.

23. Test conditions shown in (a) of AC Test Loads unless otherwise noted.

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