Rainbow Electronics AT45DB021D User Manual
Page 31
31
3638K–DFLASH–11/2012
AT45DB021D
Table 16-3.
AC Characteristics – RapidS/Serial Interface
Figure 16-1. Input Test Waveforms and Measurement Levels
t
R
, t
F
< 2ns (10% to 90%)
Symbol
Parameter
Min
Typ
Max
Units
f
SCK
SCK Frequency
66
MHz
f
CAR1
SCK Frequency for Continuous Array Read
66
MHz
f
CAR2
SCK Frequency for Continuous Array Read (Low Frequency)
33
MHz
t
WH
SCK High Time
6.8
ns
t
WL
SCK Low Time
6.8
ns
t
SCKR
(1)
SCK Rise Time, Peak-to-Peak (Slew Rate)
0.1
V/ns
t
SCKF
(1)
SCK Fall Time, Peak-to-Peak (Slew Rate)
0.1
V/ns
t
CS
Minimum CS High Time
50
ns
t
CSS
CS Setup Time
5
ns
t
CSH
CS Hold Time
5
ns
t
SU
Data In Setup Time
2
ns
t
H
Data In Hold Time
3
ns
t
HO
Output Hold Time
0
ns
t
DIS
Output Disable Time
27
35
ns
t
V
Output Valid
6
ns
t
WPE
WP Low to Protection Enabled
1
µs
t
WPD
WP High to Protection Disabled
1
µs
t
EDPD
CS High to Deep Power-down Mode
3
µs
t
RDPD
CS High to Standby Mode
35
µs
t
XFR
Page to Buffer Transfer Time
200
µs
t
comp
Page to Buffer Compare Time
200
µs
t
EP
Page Erase and Programming Time (256-/264-bytes)
14
35
ms
t
P
Page Programming Time (256-/264-bytes)
2
4
ms
t
PE
Page Erase Time (256-/264-bytes)
13
32
ms
t
BE
Block Erase Time (2,048-2,112-bytes)
15
35
ms
t
SE
Sector Erase Time (32,768-/33,792-bytes)
400
700
ms
t
CE
Chip Erase Time
3.6
6
s
t
RST
RESET Pulse Width
10
µs
t
REC
RESET Recovery Time
1
µs
AC
DRIVING
LEVELS
AC
MEASUREMENT
LEVEL
0.45V
1.5V
2.4V