Patton electronic 2710 - Manual (Page 37)

37
5.3 BIT ERROR RATE (V.52) DIAGNOSTICS
The NetLink-T1™ offers three V.52 Bit Error Rate (BER) test patterns.
These test patterns may be invoked along with the LAL and RDL tests to
evaluate the unit(s) and the communication links.
When a 511, 2047, or QRSS test is invoked, the NetLink-T1™ generates
a pseudo-random bit pattern of 511 bits, 2047 bits or 220 bits, respec-
tively, using a mathematical polynomial. The receiving NetLink- T1™
then decodes the received bits using the same polynomial. If the
received bits match the agreed upon pseudo-random pattern, then the
NetLink-T1™(s) and the communication link(s) are functioning properly.
511– Initiates a built-in 511 bit pseudo-random pattern generator
and detector.
2047– Initiates a built-in 2047 bit pseudo-random pattern generator
and detector.
QRSS– Initiates a built-in 220 bit pseudo-random pattern generator
and detector.
To perform a V.52 test, follow these steps:
1. Activate the local loopback or remote loopback diagnostic.
2. Activate the test pattern. This may be done in one of two ways:
— Enter Test Pattern from the System Diagnostics/Statistics
menu and toggle the until the desired test pattern
appears.
— One of two result codes will appear to the right of the Test
Pattern listing:
OK– Indicates that the received test pattern is error-free.
BE– Indicates that there are errors in the test pattern (to delib-
erately insert errors in the pattern, toggle Error Insertion
to ON).