Test e62 walk_monleds, Test e63 update_vcc_lim, Teste62walkmonleds - 2 3 – Fluke 900 User Manual

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FLUKE 900 SERVICE MANUAL

Selftest

Byte 1 - bit 7 is set if any overlay failed. The other bits indicate which overlay failed

first When one overlay fails the remaining ones are not tested. They are
tested in ascending order.

0000 - SYSCOM, SYSB or SYSD
0001 - SEQ, SYSB or SYSD
0010-

COMPIL, SYSB or SYSD

0011-

USER, SYSB or SYSD

0100-

MATH, SYSB or SYSD

0101-

DISP, SYSB or SYSD

0110 - COM, SYSB or SYSD
0111 - FILE_U, SYSB or SYSD

1010-RDTEST, SYSAForSYSC
1011 - SLFTST, SYSAF or SYSC
1100-

MISC, SYSAForSYSC

1101-

EDITOR,

SYSAForSYSC

1110 -

LOG,

SYSAF or SYSC

nil-OTHER,

SYSAForSYSC

Byte 2 -

data bits that failed when the SRAM was tested.

Byte 3 -

This indicates the DRAM chips that failed on earlier Micro boards that used 8

DRAM chips. For boards that have 2 DRAM devices only at U82 and U86, any
bit can indicate either of the DRAMs.

B7-U86
B6-U82
B5 - U87
B4 - U83
B3-U88
B2 - U84
B1-U89
BO - U85

TEST E62
WALK_MONLEDS

This test turns off all of the MONITOR LED’s and walks each one on. It then turns on aU of
the LED’s and walks each one off. This test is visual and is not executed during power-up

selltest.

TEST E63

UPDATE_VCC_LIM

This test reads the current value of Vcc on the buffer and updates the stored minimiini and
maximum readings if necessary.

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