Tests 1 2, Pullo_mon, pull1_mon, Tests 3,4 – Fluke 900 User Manual
Page 31: Pull0_flt, pull1_flt, Tests 5,6, Synco_hres_flt, syncl_hres_flt, Tests 7 8, Sync0_lres_flt, sync1_lres_flt, Tests 9,10, Pindiso_flt, pindis1_flt
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FLUKE 900 SERVICE MANUAL
Selftest
TESTS 1 2
PULLO_MON, PULL1_MON
These tests supply a walking 0 or 1 across all lines from the pull-tq)s latch, through the iiqnit
buffer, to the MONBUS where the levels are read by the (TPU.
TESTS 3,4
PULL0_FLT, PULL1_FLT
These tests supply a walking 0 or 1 across all lines fixnn the pull-ups latch, through die iiqnit
buffer, through the fault circuitry to the MONBUS where the levels are read by the CPU.
TESTS 5,6
SYNCO_Hres_FLT, SYNCl_Hres_FLT
These tests supply a walking 0 or 1 across all lines from the sync latch, through the HI
resistors, through the fault circuitry to the MONBUS where the levels are read by the CPU.
TESTS 7 8
SYNC0_Lres_FLT, SYNC1_Lres_FLT
These tests supply a walking 0 or 1 across all lines from the sync latch, through the LO
resistors, through the fault circuitry to the MONBUS where the levels are read by the CPU.
TESTS 9,10
PINDISO_FLT, PINDIS1_FLT
These tests supply a walking 0 or 1 across aU lines from the pin disabling latch, through the
fault circuitry to the MONBUS where the levels are read by the CPU.
TESTS 11,12
SLFTSTO_FLT, SLFTST1_FLT
These tests supply a walking 0 or 1 across all lines from the selftest latch, through the fault
circuitry to the MONBUS where the levels are read by the CPU.
TESTS 13,14
VccON_FLT, GndON_FLT
These tests walk the Vcc or Gnd relays on. Their operation is verified through the fault
circuitry to the MONBUS where the levels are read by the CPU.
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