Fluke 900 User Manual

Fluke 900 service manual

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FLUKE 900

SERVICE MANUAL

NOTE:

This manual documents FLUKE900 instruments S/N 4720000 and above.

It also documents any FLUKE 900 vnth the Simulation Option (900-001) installed.

Print Date: September 1992
MN-0004
FLUKE P/N 889691

ZTEST Electronics Inc.
1305 Matheson Blvd.
Mississauga, Ontario
Canada L4W1R1

Table of contents

Document Outline

Table of Contents
1 Service Manual Introduction
1.1 Description of Operator, Service Manuals
1.2 Basic Operation of Keyboard and Display
2 Theory of Operation
2.1 General
2.2 Interface Buffer
2.3 Micro Board
2.4 High Speed Board
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2.5 Test Clips
3 Selftest
3.1 Reading Selftest Results
3.1.1 General Selftest Results
3.1.3 Chip Size LED Error Codes
3.2 Running and Reading Individual Selftests
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3.3 Individual Selftest Descriptions
TEST 0 SLFT_CLIP
TESTS 1 2
PULLO_MON, PULL1_MON
TESTS 3,4
PULL0_FLT, PULL1_FLT
TESTS 5,6
SYNCO_Hres_FLT, SYNCl_Hres_FLT
TESTS 7 8
SYNC0_Lres_FLT, SYNC1_Lres_FLT
TESTS 9,10
PINDISO_FLT, PINDIS1_FLT
TESTS 11,12
SLFTSTO_FLT, SLFTST1_FLT
TESTS 13,14 VccON_FLT, GndON_FLT
TEST 15 PULLPOS_FREQ
TESTS 16,17
TRIGQALO_EQUAL, TRIGQAL1_EQUAL
TESTS 18,19
QAL0_EQUAL, QAL1_EQUAL
TRIGO_EQUAL, TRIG1_EQUAL
TESTS 22 23
PULLO_TRIG_EQUAL, PULL1_TRIG_EQUAL
TESTS 25,26
FM_STAT_NFLT, FM_STAT_FLT
TEST 27
FMASK_WB_TEST
TEST 28 FMASK_CAL
TESTS 29,31,33,35,37,39 FMxx_FLT
TESTS 30,32,34,36,38,40 FMxx_NFLT
TEST 41 ACT_DIS_CLR
TESTS 42 43
PULLO_ACT_TSTON, PULL1_ACT_TSTON
TESTS 44, 45
PULLO_ACT_ACTSTR, PULL1_ACT_ACTSTR
TESTS 46,47
Interface Buffer shift register subtest
Frequency HW subtest
Threshold HW subtest
Reset HW subtest
Result bytes:
TEST 48
KEYBOARD_OPEN
TEST 49 TEST_CYCLE
TEST 50 UART_TEST
TEST 51 DGATE_TEST
TEST 52 PULL0_XTRIG
TEST 53 PULL1_XTRIG
TEST 54 PULL_XEVENT
TEST 55 SHADJNIT
TEST E60 WALK_SIZELEDS
TEST E61 TEST_MEMORY
TEST E62 WALK_MONLEDS
TEST E63 UPDATE_VCC_LIM
TEST E64 SHAD_ADDR
TEST E70 KEY_CLOSURE
TEST E71 DISP_RAM
TEST E74 DISP_CHAR_SET
TEST E75 CART_SLFT
TEST E76 TEST_C_ENG
TEST E77 ACT_CROSS
TEST E78 TRG_CROSS
TEST E79 FRQ_CROSS
TEST E80 FLT_CROSS
3.4 System Error Codes
4 Troubleshooting
4.1 Test Result Interpretation
4.2 Selftest / Circuit Block Reference Table
- FLUKE 900 SERVICE MANUAL
4.3 Selftest Circuit Block Diagrams
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- 4.4.2 Static-blown HSB
- 4.4.3 Missing -5 V
- 5.3.2 Keyboard
- 5.3.3 Speaker
- 5.3.4 Display Controller
- 5.3.5 Display
- 5.3.6 High Speed Board
- 5.3.7 Power Supply
- 5.3.7.1 Fan
- 5.3.8 Interface Buffer Board
- 5.4 Calibration Procedures
- 5.4.1 Interface Buffer Calibration
- 5.4.2 High Speed Board Calibration
- 5.4.2.1 Calibration Data Format
- S.4.2.4 The Offset Shift (OS) Definition
- 5.4.2.4.1 Example 1 (for negative offsets)
- 5.4.2A.2 Example 2 (for positive offsets)
- 5.4.2.5 The Correcting Component Definition
- S.4.2.6 Calibration Procedure
- 5.4.2.6.1 Offsets Block
- 5.4.2.6.2 Limits Block
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- 5.4.2.6.3 Selftest buffer and 86 gate related condition
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- 5.4.2.6.4 LM360 comparator related condition
- 5.5 Board Revisions, Upgrades and ECOs
- 5.5.1 Modification to MB for 64k Cartridges
- 5.5.2 900 System Firmware
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- 7.1 900 Final Assembly
- 7.2 A1 Interface Buffer IB
- 7.3 A2 Micro Board M2
- 7.4 A3 High Speed H3
- 7.5 A4 Power Supply Module PA