Test 51 dgate_test, Test 51 dgate_test -17 – Fluke 900 User Manual
Page 41
Attention! The text in this document has been recognized automatically. To view the original document, you can use the "Original mode".
FLUKE 900 SERVICE MANUAL
Selftest
BYTE 2 -RSCNT[3,2,1] = 001
b7-DTR=0,
RTS=1,
test
for
CTS=1
b6 - DTR=0, RTS=0, test for CTS=0
b5-DTR=l,
RTS=1,
test
for
CTS=1
b4 - DTR=1, RTS=0, test for CTS=0
b3 - DTR=0, RTS=0, test for DCD=0
b2 - DTR=1, RTS=0, test for DCD=1
bl - DTR=0, RTS=1, test for DCD=0
bO - DTR=1, RTS=1, test for DCD=1
BYTE 3 -RSCNT[3,2,1] = 110
b7-DTR=0,
RTS=1,
test
for
CTS=1
b6 - DTR=0, RTS=0, test for CTS=0
b5 - DTR=1, RTS=1, test for CTS=1
b4-DTR=l,
RTS=0,
test
for
CTS=0
b3-DTR=0,
RTS=0,
test
for
DCD=0
b2-DTR=l,
RTS=0,
test
for
DCD=1
bl-DTR=0,
RTS=1,
test
for
DCD=0
bO - DTR=1, RTS=1, test for DCD=1
TEST 51
DGATE_TEST
This test is performed only if the Simulation Option (900-001) is installed. It verifies the
functionality of the delayed-gate circuit. It checks the operation of the pre-scaler, the delay
function, the duration function and the delayed-gate-activity circuit. Results are interpreted
as follows:
1
B7
1 B6
1 0
1
B5
1
B4
1
-4- —
B3
1
— 4- —.
B2 1
Bl
1 BO
_ j ________
BYTEO1
0
-- 1-------------
1DGATE
T-------------
1DGATE 1 INF
1
0 1
PRE-
--l- — — — — — —
1 INVERT
1
1
1 ACT
1 CLR
1 DUR
1 DELAY 1
SCALER 1 FAIL
BYTEl1
/15
1 /14
1 /12
1 /10
1
/8
1
/6 1
/4
1 /2
|1 .667MI1.786MI2•083MI 2.5M
13.125MI4
•
17MI6.25M 112.5M
BYTE21
D
U
R
A
T
I
0
N
1 128
1 64
1
32
1
16
1
8
1
4 1
2
1 1
BYTE31
D
E
L
A
Y
1 128
1 64
1
32
1
16
1
8
1
4 1
2
1 1
3 - 1 7