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Cypress CY7C1312AV18 User Manual

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CY7C1310AV18

CY7C1312AV18

CY7C1314AV18

PRELIMINARY

Document #: 38-05497 Rev. *A

Page 14 of 21

is loaded into the instruction register upon power-up or

whenever the TAP controller is given a test logic reset state.

SAMPLE Z
The SAMPLE Z instruction causes the boundary scan register

to be connected between the TDI and TDO pins when the TAP

controller is in a Shift-DR state. The SAMPLE Z command puts

the output bus into a High-Z state until the next command is

given during the “Update IR” state.

SAMPLE/PRELOAD
SAMPLE / PRELOAD is a 1149.1 mandatory instruction.

When the SAMPLE / PRELOAD instructions are loaded into

the instruction register and the TAP controller is in the Cap-

ture-DR state, a snapshot of data on the inputs and output pins

is captured in the boundary scan register.
The user must be aware that the TAP controller clock can only

operate at a frequency up to 10 MHz, while the SRAM clock

operates more than an order of magnitude faster. Because

there is a large difference in the clock frequencies, it is possi-

ble that during the Capture-DR state, an input or output will

undergo a transition. The TAP may then try to capture a signal

while in transition (metastable state). This will not harm the

device, but there is no guarantee as to the value that will be

captured. Repeatable results may not be possible.
To guarantee that the boundary scan register will capture the

correct value of a signal, the SRAM signal must be stabilized

long enough to meet the TAP controller's capture set-up plus

hold times (t

CS

and t

CH

). The SRAM clock input might not be

captured correctly if there is no way in a design to stop (or

slow) the clock during a SAMPLE / PRELOAD instruction. If

this is an issue, it is still possible to capture all other signals

and simply ignore the value of the CK and CK# captured in the

boundary scan register.
Once the data is captured, it is possible to shift out the data by

putting the TAP into the Shift-DR state. This places the bound-

ary scan register between the TDI and TDO pins.
PRELOAD allows an initial data pattern to be placed at the

latched parallel outputs of the boundary scan register cells pri-

or to the selection of another boundary scan test operation.

The shifting of data for the SAMPLE and PRELOAD phases

can occur concurrently when required - that is, while data

captured is shifted out, the preloaded data can be shifted in.

BYPASS

When the BYPASS instruction is loaded in the instruction

register and the TAP is placed in a Shift-DR state, the bypass

register is placed between the TDI and TDO pins. The

advantage of the BYPASS instruction is that it shortens the

boundary scan path when multiple devices are connected

together on a board.

EXTEST

The EXTEST instruction enables the preloaded data to be

driven out through the system output pins. This instruction also

selects the boundary scan register to be connected for serial

access between the TDI and TDO in the shift-DR controller

state.

EXTEST OUTPUT BUS TRI-STATE
IEEE Standard 1149.1 mandates that the TAP controller be

able to put the output bus into a tri-state mode.
The boundary scan register has a special bit located at bit #47.

When this scan cell, called the "extest output bus tristate", is

latched into the preload register during the "Update-DR" state

in the TAP controller, it will directly control the state of the

output (Q-bus) pins, when the EXTEST is entered as the

current instruction. When HIGH, it will enable the output

buffers to drive the output bus. When LOW, this bit will place

the output bus into a High-Z condition.
This bit can be set by entering the SAMPLE/PRELOAD or

EXTEST command, and then shifting the desired bit into that

cell, during the "Shift-DR" state. During "Update-DR", the

value loaded into that shift-register cell will latch into the

preload register. When the EXTEST instruction is entered, this

bit will directly control the output Q-bus pins. Note that this bit

is pre-set HIGH to enable the output when the device is

powered-up, and also when the TAP controller is in the

"Test-Logic-Reset" state.

Reserved
These instructions are not implemented but are reserved for

future use. Do not use these instructions.

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