Teledyne LeCroy QPHY-DDR2 - Manual (Page 45)

QPHY-DDR2 Software Option
QPHY-DDR2-OM-E Rev A
45
JESD79-2E Specific Note 8 (page 85 to 94) with tables 43 and 44 explain the limit compensation versus the
slewrate of the measured signals. Timing limits are initially specified for input slewrate of 1V/ns for single-ended
signals and 2V/ns for differential signal (for DQS and CK).
Figure 28. Data input (write) timing [JESD79-2E figure 38]
Figure 29. Differential input waveform timing - tDS and tDH [JESD79-2E figure 98]
tDS1(base), DQ and DM input setup time (single-ended strobe)
This test is only applicable only on 400 and 533 MHz devices.
Input waveform timing with single-ended data strobe enabled, is referenced from the input signal crossing at the
VIH(ac)min level to the single-ended data strobe crossing VIH(dc)min or VIL(dc)max at the start of its transition for
a rising signal, and from the input signal crossing at the VIL(ac)max level to the single-ended data strobe crossing
VIH(dc)min or VIL(dc)max at the start of its transition for a falling signal applied to the device under test. The DQS
signal must be monotonic between VIL(dc)max and VIH(dc)min. See Figure 30 as follows.
Jedec JESD79-2E Specific Note 8 (page 85 to 94) with table 45 explain the limit compensation versus the
slewrate of the measured signals. Timing limits are initially specified for input slewrate of 1V/ns for single-ended
signals and 2V/ns for differential signal (for DQS and CK).
tDH1(base), DQ and DM input hold time (single-ended strobe)
This test is only applicable only on 400 and 533 MHz devices.
Input waveform timing with single-ended data strobe enabled, is referenced from the input signal crossing at the
VIH(dc)min level to the single-ended data strobe crossing VIH(ac)min or VIL(ac)max at the end of its transition for
a rising signal, and from the input signal crossing at the VIL(dc)max level to the single-ended data strobe crossing
VIH(ac)min or VIL(ac)max at the end of its transition for a falling signal applied to the device under test. The DQS