Teledyne LeCroy QPHY-DDR2 - Manual (Page 37)

QPHY-DDR2 Software Option
QPHY-DDR2-OM-E Rev A
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6 ≤ n ≤ 10 for tERR(6-10per)
11 ≤ n ≤ 50 for tERR(11-50per)
Measured on both the rising and the falling edge.
Eye Diagram
Write Burst (Inputs)
This is an informational only test that creates the eye diagram of all of the write bursts found in the acquisition.
Read Burst (Outputs)
This is an informational only test that creates the eye diagram of all of the read bursts found in the acquisition.
Electrical Tests
Write Bursts (Inputs)
Slew (Input Slewrate)
This test applies to all input signals.
SlewR and SlewF
Apply to all input signals.
The input signal minimum slew rate is to be maintained over the range from VREF to VIH(ac) min for rising edges
(SlewR) and the range from VREF to VIL(ac) max for falling edges (SlewF) of single-ended signal.
For differential signals (e.g. CK - CK#) slew rate for rising edges is measured from CK - CK# = - 250 mV to CK -
CK# = + 500 mV (+ 250 mV to - 500 mV for falling edges).
Figure 21. AC input test signal waveform [JESD79-2E figure 73]
Logic Levels
VIH(ac), maximum AC input logic high
Measure the local maximum value from VREF to VREF of the high pulse histogram. If multiple pulses are
measured, take the lowest number and the highest number as the worst cases.
The lowest number must be greater than or equal to the minimum limit and the highest number must be less than