Ac read characteristics, Ac read waveforms(1)(2)(3)(4), Input test waveforms and measurement level – Rainbow Electronics AT28HC256 User Manual
Page 5: Output test load, Pin capacitance, Ac read waveform s
AT28HC256
5
AC Read Waveforms
Notes:
1. CE may be delayed up to t
ACC
- t
CE
after the address transition without impact on t
ACC
.
2. OE may be delayed up to t
CE
- t
OE
after the falling edge of CE without impact on t
CE
or by t
ACC
- t
OE
after an address change
without impact on t
ACC
.
3. t
DF
is specified from OE or CE whichever occurs first (C
L
= 5 pF).
4. This parameter is characterized and is not 100% tested.
Input Test Waveforms and
Measurement Level
Output Test Load
Note:
1. This parameter is characterized and is not 100% tested.
AC Read Characteristics
Symbol
Parameter
AT28HC256-70
AT28C256-90
AT28HC256-12
Units
Min
Max
Min
Max
Min
Max
t
ACC
Address to Output Delay
70
90
120
ns
t
CE
CE to Output Delay
70
90
120
ns
t
OE
OE to Output Delay
0
35
0
40
0
50
ns
t
DF
CE or OE to Output Float
0
35
0
40
0
50
ns
t
OH
Output Hold from OE, CE or Address,
whichever occurred first
0
0
0
ns
t
R
, t
F
< 5 ns
Pin Capacitance
f = 1 MHz, T = 25°C
Symbol
Typ
Max
Units
Conditions
C
IN
4
6
pF
V
IN
= 0V
C
OUT
8
12
pF
V
OUT
= 0V