A technical specifications, Mportant, Specifications – EXFO FTB-5230S Optical Spectrum Analyzer for FTB 200 v2 User Manual
Page 241: Osa/oca, Power measurement, Spectral measurement, General specifications, Upgrades, Laser safety, Optical measurement

OSA/OCA
235
A Technical Specifications
I
MPORTANT
The following technical specifications can change without notice.
The information presented in this section is provided as a reference
only. To obtain this product’s most recent technical specifications,
visit the EXFO Web site at www.exfo.com.
POWER MEASUREMENT
Dynamic range (dBm) (per channel)
b
-65
d
to 23 dB
Maximum total safe power (dBm)
29
Absolute power uncertainty (dB)
h
±0.6 (0.4 typical)
Power repeatability 2
m (dB)
d, g
±0.1
SPECTRAL MEASUREMENT
Wavelength range (nm)
1250 to 1650
Wavelength uncertainty (nm)
b
±0.05
±0.02
c, d
Reference
Internal
e
Resolution bandwidth (FWHM)
f
(nm)
0.10
b, d
Wavelength repeatability 2
m (nm)
±0.005
g
Analysis modes
WDM and drift (FTB-5230S) / Optical Channel Analyzer mode (FTB-5230S-OCA)
SPECIFICATIONS
GENERAL SPECIFICATIONS
Temperature
operating
storage
0 °C to 40 °C (32 °F to 104 °F)
—20 °C to 50 °C (—4 °F to 120 °F)
Connectors
EI (EXFO UPC Universal Interface)
EA (EXFO APC Universal Interface)
Size (H x W x D)
FTB-5230S module
96 mm x 51 mm x 260 mm (3 ¾ in x 2 in x 10 ¼ in)
Weight
FTB-5230S module
1. 5 kg (3.3 lb)
UPGRADES
WDM: enables upgrade from FTB-5230S-OCA
to FTB-5230S (software option)
LASER SAFETY
21 CFR 1040.10 AND IEC 60825-1
CLASS 1 LASER PRODUCT
OPTICAL MEASUREMENT
Optical rejection ratio at 1550 nm (dB)
at 0.2 nm (25 GHz)
at 0.4 nm (50 GHz)
31 (35 typical)
40 (45 typical)
Channel spacing
33 to 200 GHz CWDM
PDL at 1550 nm (dB)
±0.1
d
ORL (dB)
>37
Measurement time (s)
d, i
(includes scanning, analysis and display)
1 (with the FTB-500 Platform)
Notes
a.
All specifications are for a temperature of 23 °C ± 2 °C with an FC/UPC connector unless
otherwise specified, after warm-up.
b. From 1520 to 1600 nm.
c.
For FTB-5230S only. After user calibration in the same test session within 10 nm from each
calibration point.
d. Typical.
e. Integrated and wavelength-independent self-adjustment.
f. Full width at half maximum.
g. Over one minute in continuous acquisition mode.
h. At 1550 nm, -10 dBm input.
i. 40 nm span.