Cypress Perform nvSRAM - Manual (Page 8)

PRELIMINARY
CY14B102L, CY14B102N
Document #: 001-45754 Rev. *B Page 8 of 24
AC Test Conditions
Input Pulse Levels.................................................... 0V to 3V
Input Rise and Fall Times (10% - 90%)........................ <3 ns
Input and Output Timing Reference Levels.................... 1.5V
Data Retention and Endurance
Parameter Description Min Unit
DATA
R
Data Retention 20 Years
NV
C
Nonvolatile STORE Operations 200 K
Capacitance
In the following table, the capacitance parameters are listed. [14]
Parameter Description Test Conditions Max Unit
C
IN
Input Capacitance T
A
= 25 °C, f = 1 MHz,
V
CC
= 0 to 3.0V
7 pF
C
OUT
Output Capacitance 7 pF
Thermal Resistance
In the following table, the thermal resistance parameters are listed. [14]
Parameter Description Test Conditions 48-FBGA 44-TSOP II 54-TSOP II Unit
Θ
JA
Thermal Resistance
(Junction to Ambient)
Test conditions follow standard test methods
and procedures for measuring thermal
impedance, in accordance with EIA/JESD51.
28.82 31.11 30.73 °C/W
Θ
JC
Thermal Resistance
(Junction to Case)
7.84 5.56 6.08 °C/W
Figure 5. AC Test Loads
3.0V
OUTPUT
5 pF
R1
R2
789 Ω
3.0V
OUTPUT
30 pF
R1
R2
789 Ω
for tri-state specs 577 Ω 577 Ω
Note
14. These parameters are guaranteed but not tested.
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