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Capacitance, Thermal resistance, Electrical characteristics – Cypress CY7C1350G User Manual

Page 8: Ac test loads and waveforms

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CY7C1350G

Document #: 38-05524 Rev. *F

Page 8 of 15

I

SB3

Automatic CE
Power-Down
Current—CMOS
Inputs

V

DD

= Max, Device Deselected, or

V

IN

≤ 0.3V or V

IN

> V

DDQ

– 0.3V

f = f

MAX

= 1/t

CYC

4-ns cycle, 250 MHz

105

mA

5-ns cycle, 200 MHz

95

mA

6-ns cycle, 166 MHz

85

mA

7.5-ns cycle, 133 MHz

75

mA

10-ns cycle, 100 MHz

65

mA

I

SB4

Automatic CE
Power-Down
Current—TTL Inputs

V

DD

= Max, Device Deselected,

V

IN

≥ V

IH

or V

IN

≤ V

IL

, f = 0

All speeds

45

mA

Capacitance

[12]

Parameter

Description

Test Conditions

100 TQFP

Max.

119 BGA

Max.

Unit

C

IN

Input

Capacitance

T

A

= 25°C, f = 1 MHz,

V

DD

= 3.3V, V

DDQ

= 3.3V

5

5

pF

C

CLK

Clock Input Capacitance

5

5

pF

C

I/O

Input/Output Capacitance

5

7

pF

Thermal Resistance

[12]

Parameter

Description

Test Conditions

100 TQFP

Package

119 BGA
Package

Unit

Θ

JA

Thermal Resistance (Junction to
Ambient)

Test conditions follow standard
test methods and procedures for
measuring thermal impedance,
per EIA/JESD51.

30.32

34.1

°C/W

Θ

JC

Thermal Resistance (Junction to
Case)

6.85

14.0

°C/W

Electrical Characteristics

Over the Operating Range

[10, 11]

(continued)

Parameter

Description

Test Conditions

Min.

Max.

Unit

AC Test Loads and Waveforms

Note:

12. Tested initially and after any design or process changes that may affect these parameters.

OUTPUT

R = 317

R = 351

5 pF

INCLUDING

JIG AND

SCOPE

(a)

(b)

OUTPUT

R

L

= 50

Z

0

= 50

V

T

= 1.5V

3.3V

ALL INPUT PULSES

V

DDQ

GND

90%

10%

90%

10%

≤ 1 ns

≤ 1 ns

(c)

OUTPUT

R = 1667

R =1538

5 pF

INCLUDING

JIG AND

SCOPE

(a)

(b)

OUTPUT

R

L

= 50

Z

0

= 50

V

T

= 1.25V

2.5V

ALL INPUT PULSES

V

DDQ

GND

90%

10%

90%

10%

≤ 1 ns

≤ 1 ns

(c)

3.3V I/O Test Load

2.5V I/O Test Load

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