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Idcode, Sample z, Sample/preload – Cypress Perform CY7C1513KV18 User Manual

Page 14: Bypass, Extest, Extest output bus tristate, Reserved

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CY7C1511KV18, CY7C1526KV18

CY7C1513KV18, CY7C1515KV18

Document Number: 001-00435 Rev. *E

Page 14 of 31

IDCODE
The IDCODE instruction loads a vendor-specific, 32-bit code into

the instruction register. It also places the instruction register

between the TDI and TDO pins and shifts the IDCODE out of the

device when the TAP controller enters the Shift-DR state. The

IDCODE instruction is loaded into the instruction register at

power up or whenever the TAP controller is supplied a

Test-Logic-Reset state.

SAMPLE Z
The SAMPLE Z instruction connects the boundary scan register

between the TDI and TDO pins when the TAP controller is in a

Shift-DR state. The SAMPLE Z command puts the output bus

into a High-Z state until the next command is supplied during the

Update IR state.

SAMPLE/PRELOAD
SAMPLE/PRELOAD is a 1149.1 mandatory instruction. When

the SAMPLE/PRELOAD instructions are loaded into the

instruction register and the TAP controller is in the Capture-DR

state, a snapshot of data on the input and output pins is captured

in the boundary scan register.
The TAP controller clock can only operate at a frequency up to

20 MHz, while the SRAM clock operates more than an order of

magnitude faster. Because there is a large difference in the clock

frequencies, it is possible that during the Capture-DR state, an

input or output undergoes a transition. The TAP may then try to

capture a signal while in transition (metastable state). This does

not harm the device, but there is no guarantee as to the value

that is captured. Repeatable results may not be possible.
To guarantee that the boundary scan register captures the

correct value of a signal, the SRAM signal must be stabilized

long enough to meet the TAP controller's capture setup plus hold

times (t

CS

and t

CH

). The SRAM clock input might not be captured

correctly if there is no way in a design to stop (or slow) the clock

during a SAMPLE/PRELOAD instruction. If this is an issue, it is

still possible to capture all other signals and simply ignore the

value of the CK and CK captured in the boundary scan register.
After the data is captured, it is possible to shift out the data by

putting the TAP into the Shift-DR state. This places the boundary

scan register between the TDI and TDO pins.

PRELOAD places an initial data pattern at the latched parallel

outputs of the boundary scan register cells before the selection

of another boundary scan test operation.
The shifting of data for the SAMPLE and PRELOAD phases can

occur concurrently when required, that is, while the data

captured is shifted out, the preloaded data can be shifted in.

BYPASS
When the BYPASS instruction is loaded in the instruction register

and the TAP is placed in a Shift-DR state, the bypass register is

placed between the TDI and TDO pins. The advantage of the

BYPASS instruction is that it shortens the boundary scan path

when multiple devices are connected together on a board.

EXTEST
The EXTEST instruction drives the preloaded data out through

the system output pins. This instruction also connects the

boundary scan register for serial access between the TDI and

TDO in the Shift-DR controller state.

EXTEST OUTPUT BUS TRISTATE
IEEE Standard 1149.1 mandates that the TAP controller be able

to put the output bus into a tristate mode.
The boundary scan register has a special bit located at bit #108.

When this scan cell, called the “extest output bus tristate,” is

latched into the preload register during the Update-DR state in

the TAP controller, it directly controls the state of the output

(Q-bus) pins, when the EXTEST is entered as the current

instruction. When HIGH, it enables the output buffers to drive the

output bus. When LOW, this bit places the output bus into a

High-Z condition.
This bit is set by entering the SAMPLE/PRELOAD or EXTEST

command, and then shifting the desired bit into that cell, during

the Shift-DR state. During Update-DR, the value loaded into that

shift-register cell latches into the preload register. When the

EXTEST instruction is entered, this bit directly controls the output

Q-bus pins. Note that this bit is preset HIGH to enable the output

when the device is powered up, and also when the TAP controller

is in the Test-Logic-Reset state.

Reserved
These instructions are not implemented but are reserved for

future use. Do not use these instructions.

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