Ata6264 [preliminary – Atmel ATA6264 User Manual
Page 56

56
4929B–AUTO–01/07
ATA6264 [Preliminary]
ISO 9141 Mode
16.23 Maximum baud rate
K
x
f
Kx
62.5
kBd
A
16.24
Propagation delay
TxD
x
= low to K
x
= low
(x = 1, 2),
measured from TxD
x
H to L to K
x
= 0.9
×
V
K30
R
Kx
= 510
Ω
to K30,
C
Kx
= 470 pF to GNDB
K
x
t
PDtL
1
µs
A
16.25
Propagation delay
TxD
x
= high to Kx = high
(x = 1, 2),
measured from TxD
x
L to H to K
x
= 0.1
×
V
K30
R
Kx
= 510
Ω
to K30,
C
Kx
= 470 pF to GNDB
K
x
t
PDtH
1
µs
A
16.26 K
x
rise time
(x = 1, 2), measured from
0.1
×
V
K30
to 0.9
×
V
K30
R
Kx
= 510
Ω
to K30,
C
Kx
= 470 pF to GNDB
K
x
t
Krise
3
µs
A
16.27 K
x
fall time
(x = 1, 2), measured from
0.9
×
V
K30
to 0.1
×
V
K30
R
Kx
= 510
Ω
to K30,
C
Kx
= 470 pF to GNDB
K
x
t
Kfall
3
µs
A
16.28
Propagation delay K
x
= low
to RxD
x
= low
(x = 1, 2), measured from
K
x
= 0.4
×
V
K30
to
RxD
x
= H to L
K
x
t
PDkL
4
µs
A
16.29
Propagation delay K
x
= high
to RxD
x
= high
(x = 1, 2), from
K
x
= 0.6
×
V
K30
to
xD
x
= L to H
K
x
t
PDkH
4
µs
A
16.30
Symmetry of transmitter
delay
(x = 1, 2),
t
SYM_Tx
= (t
PDtL
+ t
Kfall
) –
(t
PDtH
+ t
Krise
)
K
x
t
SYM_Tx
–1
1
µs
A
16.31
Symmetry of receiver
propagation delay
(x = 1, 2),
t
SYM_Rx
= t
PDkL
– t
PDkH
K
x
t
SYM_Rx
–1
1
µs
A
LIN Bus Mode (Necessary for Operation: V
K30
= 8V to 18V)
16.32
Slew rate for rising and
falling edge
Measured between
high level = 0.8
×
V
K30
and
low level = 0.2
×
V
K30
,
R
K1
= 1 k
Ω
to K30,
C
K1
= 3.3 nF to GNDB
K
1
dV
K1
/dt
1
3
V/µs
A
16.33 Maximum baud rate
K
1
t
Kx
20
kBd
A
16.34
Propagation delay TxD
1
low
to K
1
= low
Measured from TxD
1
H-> L to K
1
= 0.9
×
V
K30
R
K1
= 1 k
Ω
to K30,
C
K1
= 3.3 nF to GNDB
K
1
t
PDtL
2.5
µs
A
16.35
Propagation delay TxD
1
high
to K
1
= high
Measured from TxD
1
L to H to K
1
= 0.1
×
V
K30
R
K1
= 1 k
Ω
to K30,
C
K1
= 3.3 nF to GNDB
K
1
t
PDtH
2.5
µs
A
16.36
Propagation delay K
1
low to
RxD
1
= low
Measured from
K
1
= 0.4
×
V
K30
to
RxD
1
= H to L
K
1
t
PDkL
4
µs
A
Table 17-1.
Electrical Characteristics (Continued)– LIN/ISO 9141 Interfaces
No.
Parameters
Test Conditions
Pin
Symbol
Min
Typ.
Max.
Unit
Type*
*) Type means: A = 100% tested, B = 100% correlation tested, C = Characterized on samples, D = Design parameter