Atec Kikusui-TOS9201 - Manual (Page 3)

6 Kikusui Electronics Corporation
Rise-time control function
In AC hipot testing, DC hipot testing
and insulation resistance testing, you
can apply a voltage gradually to reach
the test voltage, instead of applying
the test voltage directly at the start of
a test. The voltage increase time can
be set to 0.1 s through 99.9 s at a
resolution of 0.1 s, and to 100 s to 200
s at a resolution of 1 s. The start voltage is also adjustable between
0% and 99% at a resolution of 1%.
Fall-time control function
In AC hipot testing, you can gradually
decrease the test voltage after a PASS
judgment. The voltage fall time is
adjustable between 0.0 s and 99.9 s at
a resolution of 0.1 s, and between 100
s and 200 s at a resolution of 1 s.
Offset cancel function
In AC hipot tests that require high sensitivity and high voltages,
currents flowing into the stray capacity of the test lead wire, jigs,
and other components can cause measurement errors. The
TOS9200/9201 features a function to cancel these offset currents.
Voltage hold function
During measurement, this function allows you to hold the value of the
voltage measured at the end of an AC or DC hipot test, as long as
the test results are being displayed. When combined with the rise-
time control function, this function enables to observe the insulation
breakdown voltage.
Maximum Leakage current and minimum resistance hold function
By selecting “MIN/MAX Mode” in the measurement mode settings,
you can hold the maximum current in hipot testing and the minimum
resistance after the judgment wait time in insulation resistance testing.
These values are shown on the tester’s display. They can also be
read back via interface (GPIB or RS-232C).
Output voltage monitoring function
When the output voltage deviates from ±(10% of setting + 50 V), the
monitoring function activates to suspend the test, thus ensuring highly
reliable testing.
Current detection response speed adjustment function
This function switches current detection response speeds for UPPER
judgment by adjusting the integrated time constant of the current
detection circuit. Three modes are available for the integrated
time constant: SLOW (about 40 ms),MID (about 4 ms) and FAST
(about 0.4 ms). SLOW mode is used in normal operations. MID
and FAST modes are more effective in detecting a discharge
occurring instantaneously or containing a large number of frequency
components. They are also useful for hipot tests of test devices that
insulation likely be breakdown, such as small electronic components.
TOS9200 SERIES
Hipot Tester with Insulation Resistance Test
Diverse functions
Memory function
Up to 100 test conditions used in AC and DC hipot testing and
insulation resistance testing, such as the test voltage, judgment value
and test time, can be stored with a specifi c name. For instance, you
can store the name of an applied safety standard and the destination
of the product to be tested. If test conditions are preset, operator can
recall relevant test conditions simply by entering the memory number.
If you previously assigned a special name to each of these test
conditions, operator can check recalled test conditions by name. The
memory function allows you to recall test conditions not only through
the recall operation on the front panel, but also by remote control.
[Storable test conditions]
Program function
By coordinating test conditions stored in an AC hipot test, DC hipot
test, and insulation resistance test, operator can sequentially run tests
that comprise up to 100 steps. When used together with the ground
bond tester TOS6200/6210, the TOS9200 Series permits continuous
tests combining test conditions stored in the TOS6200, as well as on
the TOS9200 itself. Sequential tests are possible, for example, on AC
hipot, insulation resistance, DC hipot, and ground bond, in order. The
TOS9200 Series stores up to 500 steps and 100 programs, which
can be recalled through the recall operation on the front panel or by
remote control.
[Sample program]
Step 00 Step 01 Step 02
Memory Interval Memory Interval Memory Interval
ACW01 0.2s DCW01 0.2s IR01 0.2s
END
At Step 00, Step 01 and Step 02, memory ACW01 (AC hipot
test), DCW (DC hipot test: TOS9201 only) and IR01 (insulation
resistance test) are performed, receptively, in succession at
0.2-second intervals.
AC withstanding
voltage testing DC withstanding
voltage testing Insulation resistance
testing
Test voltage ✔ ✔ ✔
Test frequency ✔
Lower cutoff value ✔ ✔ ✔
ON/OFF of the lower
judgment function ✔ ✔ ✔
Upper cutoff value ✔ ✔ ✔
ON/OFF of the upper
judgment function ✔
ON/OFF of the offset
function ✔
Test time and ON/OFF
of the timer function ✔ ✔ ✔
Start voltage ✔ ✔
Voltage rise time ✔ ✔ ✔
Voltage fall time ✔
Judgment wait time ✔ ✔
Test voltage range ✔
SLOW/MID/FAST settings
for the response fi lter ✔
FLOAT/GND of the
LOW terminal ✔ ✔ ✔
HIGH/LOW/OPEN settings
for the scanner channel ✔ ✔ ✔
ON/OFF of the contact
check function ✔ ✔ ✔