Atec Aeroflex-IFR-3416 - Manual (Page 2)

The electronic attenuator is ideal for high volume applications where
attenuator life is critical. A user defined RF level limit can be entered
to ensure that the signal generator cannot provide damaging signal
levels when testing less robust components. Careful attention to the
level control system guarantees that positive level transients cannot be
generated. T he fast responding electronic reverse power protection
system helps ensure long life and high reliability when testing high
power systems.
Receiver measurements require good spectral purity from a signal
generator. T he 3410 series has excellent performance with typically
1.5 Hz residual FM at 1 GHz and a floor noise of typically better than
-148 dBc / Hz.
Fast frequency and RF level setting times are key parameters in
achieving minimum test execution times and therefore maximum
throughput, in production environments. T he 3410 series with typi-
cal frequency setting times of 2 ms and level setting times of 2.5 ms
provide outstanding performance.
In addition to comprehensive sweep functions for carrier frequency,
RF level and modulation oscillator 3410 series provides an extremely
fast optional sweep mode for frequency and level settings through the
use of user stored lists. Option 010, List Mode has a setting time of
less than 500 µs and is ideal for frequency hopping and semi-con-
ductor production applications.
Comprehensive modulation facilities are provided for supporting the
testing of analog or digital RF systems. A single key press turns the
modulation on and off, providing a fast method for signal to noise
checking.
T he built-in IQ modulator provides state-of-the-art vector modulat-
ed signals with excellent level linearity, low vector error and low noise.
With a typical vector bandwidth up to 55 MHz, the modulator is able
to support wideband as well as narrow-band wireless standards.
Internal calibration systems ensure the modulator performance can
be quickly optimized to reduce vector errors and ensure low carrier
leak at all operating frequencies.
The linearity of the modulator and the RF output system is reflected
in the excellent adjacent channel power when generating multi-carri-
er non-constant envelope signals such as cellular CDMA and
TETRA.
With typical AM bandwidth to 30 MHz and typical FM bandwidth to
20 MHz, the 3410 series signal generators are ideal tools for testing
broadcast systems. The wide bandwidths allow video signals to mod-
ulate the carrier with minimal distortion.
T he wideband FM facilities allow the generation of fast-swept sig-
nals, while the use of a patented DC FM system ensures that carrier
frequency errors when the FM is DC coupled are minimal.
The specifications for AM are maintained to high carrier frequencies
to support the use in modern EMC testing applications. The signal
generator maintains excellent phase noise performance even when
generating wideband modulated signals.
An internal modulation oscillator is provided which can be used to
generate two tones in the frequency range 0.1 Hz to 50 kHz (16 MHz
with Option 005 ARB Waveform Generator). In addition to sine
waves, the modulation oscillator can provide square waves, triangular
and sawtooth waveforms for narrow band sweeping.
T he user has a choice of either a Dual Arbitrar y Waveform Generator
or a Real Time Baseband Generator for producing digitally modulat-
ed output signals.
Fitted internally, the optional Dual Channel Arbitrar y Waveform
Generator allows the user to select from a librar y of pre-stored IQ
modulator drive waveforms to provide accurately modulated carriers
simulating the characteristics of digitally modulated communication
systems. Burst modulation and alternate level rf attenuation facilities
are provided for TDMA signal simulation. Marker output signals can
be placed within the waveform to simplify triggering and synchro-
nization with external test equipment. Using a patented technique,
the dual channel ARB is able to take waveform files typically four
times oversampled and run them through a real time interpolation