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5 program and erase characteristics, 6 power-up conditions, 7 input test waveforms and measurement levels – Rainbow Electronics AT25DF081 User Manual

Page 30: 8 output test load

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30

3674E–DFLASH–8/08

AT25DF081

Notes:

1. Not 100% tested (value guaranteed by design and characterization).

12.7

Input Test Waveforms and Measurement Levels

12.8

Output Test Load

12.5

Program and Erase Characteristics

Symbol

Parameter

Min

Typ

Max

Units

t

PP

Page Program Time (256 Bytes)

1.0

5.0

ms

t

BP

Byte Program Time

15

µs

t

BLKE

Block Erase Time

4-Kbyte

50

200

ms

32-Kbyte

350

600

64-Kbyte

600

950

t

CHPE

(1)

Chip Erase Time

8

14

sec

t

WRSR

(1)

Write Status Register Time

200

ns

12.6

Power-Up Conditions

Symbol

Parameter

Min

Max

Units

t

VCSL

Minimum V

CC

to Chip Select Low Time

70

µs

t

PUW

Power-up Device Delay Before Program or Erase Allowed

10

ms

V

POR

Power-On Reset Voltage

0.9

1.1

V

AC

DRIVING

LEVELS

AC

MEASUREMENT

LEVEL

0.1V

CC

V

CC

/2

0.9V

CC

t

R

, t

F

< 2 ns (10% to 90%)

DEVICE

UNDER

TEST

30 pF