5 program and erase characteristics, 6 power-up conditions, 7 input test waveforms and measurement levels – Rainbow Electronics AT25DF081 User Manual
Page 30: 8 output test load

30
3674E–DFLASH–8/08
AT25DF081
Notes:
1. Not 100% tested (value guaranteed by design and characterization).
12.7
Input Test Waveforms and Measurement Levels
12.8
Output Test Load
12.5
Program and Erase Characteristics
Symbol
Parameter
Min
Typ
Max
Units
t
PP
Page Program Time (256 Bytes)
1.0
5.0
ms
t
BP
Byte Program Time
15
µs
t
BLKE
Block Erase Time
4-Kbyte
50
200
ms
32-Kbyte
350
600
64-Kbyte
600
950
t
CHPE
Chip Erase Time
8
14
sec
t
WRSR
Write Status Register Time
200
ns
12.6
Power-Up Conditions
Symbol
Parameter
Min
Max
Units
t
VCSL
Minimum V
CC
to Chip Select Low Time
70
µs
t
PUW
Power-up Device Delay Before Program or Erase Allowed
10
ms
V
POR
Power-On Reset Voltage
0.9
1.1
V
AC
DRIVING
LEVELS
AC
MEASUREMENT
LEVEL
0.1V
CC
V
CC
/2
0.9V
CC
t
R
, t
F
< 2 ns (10% to 90%)
DEVICE
UNDER
TEST
30 pF
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