Rainbow Electronics AT77C102B User Manual
Page 6
6
5364A–BIOM–09/05
AT77C102B
Table 3-3.
Resistance
Parameter
Min Value
Standard Method
ESD
On pins. HBM (Human Body Model) CMOS I/O
2 kV
MIL-STD-883 - method 3015.7
On die surface (Zapgun)
Air discharge
±16 kV
NF EN 6100-4-2
Mechanical Abrasion
Number of cycles without lubricant multiply by an estimated factor
of 20 for correlation with a real finger
200 000
MIL E 12397B
Chemical Resistance
Cleaning agent, acid, grease, alcohol, diluted acetone
4 hours
Internal method
Table 3-4.
Specifications
Explanation Of Test Levels
I
100% production tested at +25°C
II
100% production tested at +25°C, and sample tested at specified temperatures (AC testing done on sample)
III Sample
tested
only
IV
Parameter is guaranteed by design and/or characterization testing
V
Parameter is a typical value only
VI
100% production tested at temperature extremes
D
100% probe tested on wafer at T
amb
= +25°C
Table 3-5.
Physical Parameter
Parameter
Test Level
Min
Typ
Max
Unit
Resolution
IV
50
µm
Size
IV
8 x 280
Pixel
Yield: number of bad pixels
I
5
Bad pixels
Equivalent resistance on TPP pin
I
20
30
47
Ω