Figure 17-7. clock timing measurement at xin, Table 17-10. main oscillation stabilization time – Samsung S3C8275X User Manual
Page 306
S3C8275X/F8275X/C8278X/F8278X/C8274X/F8274X
ELECTRICAL
DATA
17-11
Table 17-10. Main Oscillation Stabilization Time
(T
A
=
− 25
°
C to + 85
°
C, V
DD
= 2.0 V to 3.6 V)
Oscillator Test
Condition
Min
Typ
Max
Unit
Crystal
fx > 1 MHz
−
−
40 ms
Ceramic
Oscillation stabilization occurs when V
DD
is
equal to the minimum oscillator voltage
range.
−
−
10 ms
External clock
X
IN
input high and low width (t
XH
, t
XL
)
62.5
−
1250 ns
t
X
t
XL
V
DD
-0.1 V
0.1 V
X
IN
1/fx
Figure 17-7. Clock Timing Measurement at X
IN