Diagnostic test types, Group 1 diagnostics, Mmio register write/read test – IBM 09-0572-000 User Manual
Page 59: Boot prom test (if the boot prom is enabled), Aip checksum test, Shared ram boundary/domain test, Shared ram write/read test, Timer test, Open adapter for ring operation test, Ring operations test
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HAPTER
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ROUBLESHOOTING
Diagnostic Test Types
The tests performed by the TokenDisk diskette Configuration
and Diagnostic Program are divided into Group 1 and
Group 2 tests.
A lobe cable must be connected from the selected adapter to
a retiming concentrator or MAU for all tests.
Group 1 Diagnostics
Group 1 diagnostics test physical components, connectors,
and circuitry of the adapter. They include the following tests:
■
MMIO Register Write/Read Test
■
Boot PROM Test (if the Boot PROM is enabled)
■
AIP Checksum Test
■
Shared RAM Boundary/Domain Test
■
Shared RAM Write/Read Test
■
Timer Test
■
Open Adapter for Ring Operation Test
■
Ring Operations Test
■
Close Adapter Test
Each of these tests is explained in more detail below.
MMIO Register Write/Read Test
This test verifies that the PC can access the adapter’s memory
mapped I/O registers correctly.
Boot PROM Test
This test verifies that the PC can access the Boot PROM
correctly and verifies the integrity of the Boot PROM.