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Data retention and endurance, Capacitance, Thermal resistance – Cypress CY14B101P User Manual

Page 23: Ac test conditions

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PRELIMINARY

CY14B101P

Document #: 001-44109 Rev. *B

Page 23 of 32

AC Test Conditions

Input Pulse Levels ....................................................0V to 3V

Input Rise and Fall Times (10% - 90%) ........................ <3 ns

Input and Output Timing Reference Levels .................... 1.5V

Data Retention and Endurance

Parameter

Description

Min

Unit

DATA

R

Data Retention

20

Years

NV

C

Nonvolatile STORE Operations

200

K

Capacitance

Parameter

[6]

Description

Test Conditions

Max

Unit

C

IN

Input Capacitance

T

A

= 25

°C, f = 1MHz,

V

CC

= 3.0V

6

pF

C

OUT

Output Pin Capacitance

8

pF

Thermal Resistance

Parameter

[6]

Description

Test Conditions

16-SOIC

Unit

Θ

JA

Thermal Resistance
(Junction to Ambient)

Test conditions follow standard test methods
and procedures for measuring thermal
impedance, per EIA / JESD51.

TBD

°C/W

Θ

JC

Thermal Resistance
(Junction to Case)

TBD

°C/W

Figure 24. AC Test Loads and Waveforms

3.0V

OUTPUT

5 pF

R1

R2

789

Ω

3.0V

OUTPUT

30 pF

R1

R2

789

Ω

577

Ω

577

Ω

Note

6. These parameters are guaranteed by design and are not tested.

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