Allied Telesis AT-2912T - Manual (Page 79)

AT-2712FX/SC and AT-2912T Secure Ethernet Network Adapter Installation and User’s Guide
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Test Descriptions This section provides descriptions of the diagnostic tests.
A1. Indirect Register Test
Function: Using an indirect addressing method, writing increment data
into MAC hash Register table and reading it back for verification. The
memory read/write is done 100 times while increment test data.
Default: Test Enabled
A2. Control Register Test
Function: Each Register specified in the configuration contents read only
bit and read/write bit defines. The test writing zero and one into the test
bits to insure the read only bits are not changed, and read/write bits are
changed accordingly.
Default: Test Enabled.
A3. Interrupt Test
Function: This test verifies the interrupt functionality. It enables interrupt
and waits for interrupt to occur. It waits for 500ms and reports error if could
not generate interrupts.
Default: Enabled
A4. BIST
Function: Hardware Built-In-Self-Test (BIST). This test initiates BIST and
waits for the test result returned by hardware.
Default: Due to the intermittent failure, this test is currently disabled by
default.
A5. PCI Cfg Register Test
Function: This test verifies the access integrity of the PCI config registers.
B1. Scratch Pad Test
Function: This test tests the scratch pad SRAM on board. The following
tests are performed:
Data Pattern Test: Writes test data into the SRAM and reads it back to
ensure data is correct. The test data used is 0x00000000, 0xFFFFFFFF,
0xAA55AA55, and 0x55AA55AA.
Alternate Data Pattern Test: Writes test data into the SRAM. Writes
complement test data into the next address. Reads back both to insure the