Atec Panametrics-Olympus-Omniscan-MX - Manual (Page 7)

7
Examples of the Focal Law Wizard
Sectorial scan display
Real-time data processing
B-scan display
A-scan and C-scan displays
Example of sensitivity
calibration
Phased Array Software
Full-Featured A-Scans, B-Scans, and C-Scans
The OmniScan ® PA builds upon the OmniScan UT feature set and
offers full-featured A-scan, B-scan, and C-scan displays.
Full-Featured Sectorial Scan
• Real-time volume-corrected representation
• Higher than 20 Hz refresh rate (up to 40 Hz)
Advanced Real-Time Data Processing
• Real-time data interpolation to improve spatial representation
of defects during acquisition of data
• User-selectable high-pass and low-pass filters to enhance
A-scan and imaging quality
• Projection feature allows the operator to view vertically
positioned A-scan simultaneously with sectorial scan image.
Calibration Procedures and Parameters
All calibration procedures are guided by a step-by-step menu
using Next and Back navigation.
Wizards for Groups and Focal Laws
• The Group Wizard allows you to enter all probe, part, and
beam parameters, and generate all focal laws in one step
instead of generating them with each change.
• The step-by-step approach prevents the user from missing a
parameter change.
• Online help provides general information on parameters to be
set.
Multiple-Group Option
It is now possible to manage more than one probe with two dif-
ferent configurations: different skews, different scanning types,
different inspection areas, and other parameters.
Possible Configurations for Multiple-Group Inspection
A Use one single phased array probe of 64 or more elements and
create 2 different groups:
Linear scan at 45º to cover the upper part
using skips on the bottom surface
Linear scan at 60º to cover the lower part
B Use one single phased array probe of 64 or 128 elements and
create 2 different groups:
Linear scan at 0º at low gain
Linear scan at 0º at higher gain
C Use one phased array probe of 64 or 128 elements and create
3 different groups:
Linear scan at 45º to cover the upper part
using skips on the bottom surface
Linear scan at 60º to cover the lower part
Sectorial scan from 35º to 70º to increase
probability of detection
D Use two phased array probes of 16 or 64 elements and create 2
different groups:
Sectorial scan from 35º to 70º for inspec-
tion from left side of the part using skips
on the bottom surface
Sectorial scan from 35º to 70º for inspec-
tion from right side of the part using skips
on the bottom surface