Adaptable parameter testing – Atec Agilent-4284A_4285A User Manual
Page 5
C-V characteristics
sample—MOS diode
5
Adaptable
parameter testing
Discover new material properties
• High accuracy and precise
measurements
• Wide frequency ranges
• High test signal levels
• Agilent 16451B dielectric test fixture
The Agilent precision LCR meter family
provides the accuracy, resolution, high
test signal and bias levels
1
required for
material measurements. Using the
Agilent 16451B dielectric test fixture
provides you with accurate permittivity
and dissipation factor measurements.
The ability to output a constant test signal
level permits repeatable and accurate
magnetic/dielectric measurements. Both
the Agilent 4284A and Agilent 4285A offer
variable voltage and current test signal
level control.
Semiconductor testing
• Extend the test cable to the DUT
• Detect small parameter changes
• Rapidly acquire data
• Test at multiple frequencies
Both instruments allow you to extend the
front panel measurement port through test
cables, switches, and probers directly to
the DUT. The 6-digits of resolution give
you the ability to sense and identify
changes not normally seen by conventional
LCR meters.
The accuracies of the Agilent 4284A at
key test frequencies up to 1 MHz permit
complete DUT evaluation for either
production or laboratory needs.
For high speed device testing at frequen-
cies above 1 MHz, the best solution is the
Agilent 4285A.
A material’s
characteristics versus
frequency
1. Need Option 4284A/4285A-001