Atec Agilent-4284A_4285A - Manual (Page 4)

Dissipation factor rise
due to high ac signal
4
Versatile component
measurements
Characterize inductive devices
• Sweep high current conditions
• Identify device properties precisely
• Test to RF frequencies
Low frequency measurements:
Agilent 4284A
Inductive devices can now be accurately
characterized from 20 Hz to 1 MHz with a
dc bias current up to 40 A
1 dc.
High frequency measurements:
Agilent 4285A
The Agilent 4285A’s wide 75 kHz to 30 MHz
range allow you to test RF inductors with
improved accuracy and 0.001 nH resolution.
Magnetic heads, ferrite-cores, and power
inductors that need to be tested at a
specified current signal level can be easily
tested with the Agilent 4285A.
Precise ceramic
capacitor measurements
• Test at 1 kHz and 1 MHz
• Resolve measurements to low values
• Maintain constant signal levels
1 kHz and 1 MHz are the primary testing
frequencies for ceramic materials and
capacitors. The Agilent 4284A can provide
these test frequencies while maintaining
an equally excellent accuracy and 6-digits
of measurement resolution.
1 MHz accuracies of capacitance (0.05%)
and dissipation factor (0.0005) are essential
for characterizing DUTs with low dissipation
factors. Dissipation factors can change as
a function of the applied test signal level
to the DUT. For reliable and consistent
measurements, the Agilent 4284A can
maintain a constant voltage test signal
level.
Inductance rolloff due
to high dc current bias
1. Need Option 4284A-001