National Instruments Data Acquisition Device E Series - Manual (Page 256)

Glossary
E Series User Manual G-6 ni.com
RTSI Real-Time System Integration—the National Instruments timing bus that
connects DAQ devices directly, by means of connectors on top of the
devices, for precise synchronization of functions.
S
s Seconds.
S Samples.
S/s Samples per second—Used to express the rate at which a digitizer or D/A
converter or DAQ device samples an analog signal.
scan interval Controls how often a scan is initialized; is regulated by the AI Sample
Clock signal.
scan rate Reciprocal of the scan interval.
SCXI Signal Conditioning eXtensions for Instrumentation—the National
Instruments product line for conditioning low-level signals within an
external chassis near sensors so that only high-level signals are sent to DAQ
devices in the noisy PC environment. SCXI is an open standard available
for all vendors.
sensor A device that responds to a physical stimulus (heat, light, sound, pressure,
motion, flow, and so on) and produces a corresponding electrical signal.
signal conditioning The manipulation of signals to prepare them for digitizing.
T
task NI-DAQmx—a collection of one or more channels, timing, and triggering
and other properties that apply to the task itself. Conceptually, a task
represents a measurement or generation you want to perform.
terminal count The highest value of a counter.
t
gh
Gate hold time.
t
gsu
Gate setup time.
t
gw
Gate pulse width.