Controls, Pass / fail acquired image inspection – IDEC DATAVS2 Series User Manual
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Instruction
Manual
SVS2
Series
38
8.5. Controls
The controls are tools used to set inspection specifications.
The SVS2 system offers a broad range of controls:
Name
Available in OR version
Available in AOR version
Brightness
Contrast
Contour Match
Edge Count
Width
Pattern Match
Position
Geometric Pattern Match
This way, the system can be adapted to meet specific inspection requirements. Controls may be
selected from the pull-down menu:
In its most basic version, the inspection process may be simplified as follows:
This simple control consists in acquisition and one single measurement/control, which will return a
certain result.
Control/
Measurement
Pass /
Fail
Acquired
Image
INSPECTION