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Test pattern – Sony FE 70-200mm f/4 G OSS Lens User Manual

Page 23

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[TEST PATTERN]

Display test patterns that are stored internally on the
projector to adjust the image without signal inputs from a
separate device.

You can select from the [Cross Hatch], [Cross Hatch
(Invert)], [Checker Flag], [Test Mode1], [Scope], and
[Flat] test patterns.
If you do not want to display a test pattern, select [Off].

Notes

• The [INPUT SELECT] and [FUNCTION] settings

cannot be changed while internal test patterns are
displayed. In addition, adjustment of some items in the
[PICTURE CONTROL] and [COLOR] tabs will be
disabled.

• While internal test patterns are displayed, some picture

quality settings will be set to optimal configurations
automatically, and adjustment of these settings will be
disabled. However, turning off the test pattern will
restore original conditions.

[SINGLE 3D] is used when projecting 3D images. For
details, contact your dealer or your local Sony
representative.